Mic-UK: A Scanning Electron Microscope in the Dining Room
LEICA / CAMBRIDGE / LEO S-440 SEM used for sale price #9161843, 1994 > buy from CAE
A Modular Atom Probe Concept: Design, Operational Aspects, and Performance of an Integrated APT-FIB/SEM Solution | Microscopy and Microanalysis | Cambridge Core
EBS Tungsten EM, SEM, TEM, Filaments for FEI, Hitachi, ISI, JEOL, Tescan, Zeiss, LEO, Cambridge Instruments and Leica electron microscopes
CSGI - Center for Colloid and Surface Science
Scanning Electron Microscopy (SEM) Energy Dispersive X-ray Spectroscopy (EDS) Mapping and In-situ Observation of Carbonization of Culms of Bambusa Multiplex | Microscopy and Microanalysis | Cambridge Core