Electronic characterization of supramolecular materials at the nanoscale by Conductive Atomic Force and Kelvin Probe Force microscopies - ScienceDirect
Advanced atomic force microscopy-based techniques for nanoscale characterization of switching devices for emerging neuromorphic applications | Applied Microscopy | Full Text
Atomic force microscopy for two-dimensional materials: A tutorial review - ScienceDirect
Probing defect dynamics in monolayer MoS2 via noise nanospectroscopy | Nature Communications
Nanomaterials | Free Full-Text | Measurements of the Electrical Conductivity of Monolayer Graphene Flakes Using Conductive Atomic Force Microscopy | HTML
Conductive atomic force microscopy study of single molecule electron transport through the Azurin-gold nanoparticle system: Applied Physics Letters: Vol 102, No 20
Advances in Atomic Force Microscopy for Probing Polymer Structure and Properties | Macromolecules
Advanced atomic force microscopy-based techniques for nanoscale characterization of switching devices for emerging neuromorphic applications | Applied Microscopy | Full Text
Advanced atomic force microscopy-based techniques for nanoscale characterization of switching devices for emerging neuromorphic applications | Applied Microscopy | Full Text
Advanced atomic force microscopy-based techniques for nanoscale characterization of switching devices for emerging neuromorphic applications | Applied Microscopy | Full Text
Frontiers | Advances in Atomic Force Microscopy: Weakly Perturbative Imaging of the Interfacial Water
a-b) Schematic of the conductive atomic force microscopy (C-AFM)... | Download Scientific Diagram
Conductive atomic force microscopy - Wikipedia
Advanced atomic force microscopy-based techniques for nanoscale characterization of switching devices for emerging neuromorphic
Atomic Force Microscopy Studies of Two-Dimensional Materials
.jpg "The Benefits of a High Vacuum for Electrical Scanning Probe Microscopy")
The Benefits of a High Vacuum for Electrical Scanning Probe Microscopy
Study of Schottky contact between Au and NiO nanowire by conductive atomic force microscopy (C-AFM): The case of surface states - ScienceDirect
Conductive AFM
PDF) Measurements of the Electrical Conductivity of Monolayer Graphene Flakes Using Conductive Atomic Force Microscopy
a) Scheme of the conductive atomic force microscope (C‐AFM) analysis in... | Download Scientific Diagram
A 2D Semiconductor–Self‐Assembled Monolayer Photoswitchable Diode - Margapoti - 2015 - Advanced Materials - Wiley Online Library
Atomic Force Microscopy-Based Force Spectroscopy and Multiparametric Imaging of Biomolecular and Cellular Systems | Chemical Reviews
